PROJ ect

Projects

Research

Comparative Analysis of Machine Learning Algorithms for Soil Erosion Modelling

Comparative Analysis of Machine Learning Algorithms for Soil Erosion Modelling Based on Remotely Sensed Data

Daniel Fernández, Eromanga Adermann, Marco Pizzolato, Roman Pechenkin, Christina G. Rodríguez, Alireza Taravat

2023

This study performs a comparative analysis of three commonly used classification algorithms—Support Vector Machine (SVM), Random Forest (RF), and Multilayer Perceptron (MLP)—in combination with ground truth samples from regions across Iceland. The process is automated to predict soil erosion risk for larger, less accessible areas using Sentinel-2 images. The analysis supports the effectiveness of these approaches for modeling soil erosion, highlighting their differences.

DOI: https://doi.org/10.3390/rs15020482

Remote Mapping of Soil Erosion Risk in Iceland

Remote Mapping of Soil Erosion Risk in Iceland

Daniel Fernández, Eromanga Adermann, Marco Pizzolato, Roman Pechenkin, Christina G. Rodríguez

2022

This study explores the application of remote sensing techniques for assessing soil erosion risk in Iceland. Due to Arctic challenges like short growing seasons, strong winds, and cloud cover, ground surveys are difficult. The paper presents a Support Vector Machine (SVM) classification model, trained with ground truth data from Iceland’s Soil Conservation Services. The methodology allows automated analysis of large, inaccessible areas using Sentinel-2 satellite images.

DOI: https://doi.org/10.5194/isprs-archives-XLVIII-4-W1-2022-135-2022

Guided Ultrasonic Wave Beam Skew in Silicon Wafers

Guided Ultrasonic Wave Beam Skew in Silicon Wafers

Marco Pizzolato, Bernard Masserey, Jean-Luc Robyr, Paul Fromme

2018

In the photovoltaic industry, monocrystalline silicon wafers are widely used for high-efficiency solar cells. Micro-cracks formed during the cutting process can lead to brittle wafer fractures, requiring non-destructive testing for quality control. This study explores the application of guided ultrasonic waves for detecting micro-crack density. The research investigates the effects of material anisotropy on guided wave characteristics, using contact piezoelectric transducers and non-contact laser interferometry. Experimental and theoretical results confirm significant wave beam skew, particularly for the S0 mode, with implications for wafer inspection techniques.

DOI: https://doi.org/10.1063/1.5031568

Lamb Wave Propagation in Monocrystalline Silicon Wafers

Lamb Wave Propagation in Monocrystalline Silicon Wafers

Paul Fromme, Marco Pizzolato, Jean-Luc Robyr, Bernard Masserey

2018

Monocrystalline silicon wafers are essential in the photovoltaic industry for producing high-efficiency solar panels. This study investigates the behavior of guided ultrasonic waves, specifically Lamb waves, for detecting micro-cracks in thin wafers. The research focuses on the effects of material anisotropy on wave propagation characteristics, including phase slowness and wave beam skewing. Experimental measurements using contact wedge transducers and laser interferometry showed strong agreement with theoretical models, with significant wave skewing observed, particularly for the S0 mode. Finite element simulations confirmed these effects, highlighting considerations for non-destructive testing of wafers.

DOI: https://doi.org/10.1121/1.5021256

High Frequency Guided Wave Propagation in Monocrystalline Silicon Wafers

High Frequency Guided Wave Propagation in Monocrystalline Silicon Wafers

Marco Pizzolato, Bernard Masserey, Jean-Luc Robyr, Paul Fromme

2017

Monocrystalline silicon wafers are widely used in the photovoltaic industry for high-efficiency solar panels. The cutting process introduces micro-cracks that can affect wafer integrity. This study investigates the propagation of high-frequency guided ultrasonic waves for wafer structural monitoring. The impact of anisotropy on wave characteristics was analyzed through three-dimensional Finite Element simulations and experimental measurements. The results confirm strong directional dependency, with selective wave mode excitation achieved using contact piezoelectric transducers and laser interferometry. Good agreement was found between simulations, experimental data, and theoretical models, demonstrating the effectiveness of guided waves for non-destructive wafer inspection.

DOI: https://doi.org/10.1117/12.2260035

About Me

Marco Pizzolato

📩 Contact Me

Hi, I’m Marco!

Some people say the world is mapped. I say it’s waiting to be explored. Whether it’s trekking across the highlands, analysing satellite images or training machine learning models, I thrive at the intersection of technology, nature, and adventure.

By day, I work as a GIS and remote sensing specialist, crafting maps, analyzing data, and making sense of the world through satellites. By night (or whenever adventure calls), I’m an aspirant alpine trekking guide, always seeking the next challenge—whether it's a mountain peak or a complex dataset.

“There’s plenty of low-hanging fruit—but I’d rather climb higher for the best view.”

With a degree in mechanical engineering and a master's in materials & process engineering, I bridge science, technology, and the environment. I’m passionate about environmental protection, sustainability, and using data-driven solutions to tackle real-world challenges.

My mission? To explore, learn, and share knowledge. Whether it’s trekking in remote landscapes, developing new data-driven insights, or helping others navigate their own paths—there’s always more to discover.

Let’s talk about maps, AI, glaciers, or the best trekking routes in Iceland—or better yet, let’s go explore!